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BOB体育登录网址_欧宝体育官网平台-APP|下载 X-Ray Diffractometer is a General Area Detector Diffraction System (GADDS-C2) which is manufactured by Bruker. The XRD system can be set up for a one off measurement of a bulk or thin film sample, or can be configured to high throughput specifications to allow the automated analysis of up to 100 measurements on a single sample.
